Shirakashi, Jun Ichi: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

Characterization of heavily carbon-doped GaAs with a hole concentration of the order of 1021 cm−3 grown by metalorganic molecular beam epitaxy and its application to InGaP/GaAs heterojunction bipolar transistors

Jun-ichi Shirakashi, Toshiaki Azuma, Fumihiko Fukuchi, Makoto Konagai, Kiyoshi Takahashi

Journal:

Journal of Crystal Growth

Year:

1995

Language:

english

File:

PDF, 483 KB

english, 1995

2

Single-Electron Transistors (SETs) with Nb/Nb Oxide System Fabricated by Atomic Force Microscope (AFM) Nano-Oxidation Process

Shirakashi, Jun-ichi, Matsumoto, Kazuhiko, Miura, Naruhisa, Konagai, Makoto

Journal:

Japanese Journal of Applied Physics

Year:

1997

File:

PDF, 588 KB

1997

3

Simultaneous fabrication of nanogap electrodes using field-emission-induced electromigration

Ito, Mitsuki, Yagi, Mamiko, Morihara, Kohei, Shirakashi, Jun-ichi

Journal:

Journal of Applied Physics

Year:

2015

Language:

english

File:

PDF, 1.63 MB

english, 2015

4

Single electron transistors fabricated with AFM ultrafine nanooxidation process

Shuichi Miyakawa, Ryangsu Kim, Jun-ichi Shirakashi, Kenji Taniguchi, Kazuhiko Matsumoto, Yoshinari Kamakura

Journal:

Electronics and Communications in Japan (Part II: Electronics))

Year:

1998

Language:

english

File:

PDF, 3.84 MB

english, 1998

5

Effect of the addition of an elemental Ga flux on the metalorganic molecular beam epitaxial growth of heavily carbon-doped InGaAs

Jun-ichi Shirakashi, Ricardo T. Yoshioka, Akifumi Miyano, Makoto Konagai, Kiyoshi Takahashi

Journal:

Journal of Crystal Growth

Year:

1994

Language:

english

File:

PDF, 371 KB

english, 1994

6

Metalorganic molecular beam epitaxial growth of InP and InGaP with tertiarybutylphosphine for the application of carbon-doped base heterojunction bipolar transistors

Jun-ichi Shirakashi, Ricardo T. Yoshioka, Toshiaki Azuma, Fumihiko Fukuchi, Makoto Konagai, Kiyoshi Takahashi

Journal:

Journal of Crystal Growth

Year:

1994

Language:

english

File:

PDF, 555 KB

english, 1994

7

InGaPGaAs and InPInGaAs heterojunction bipolar transistors with a super heavily carbon-doped base grown by metalorganic molecular beam epitaxy

Jun-Ichi Shirakashi, Makoto Konagai

Journal:

Solid-State Electronics

Year:

1995

Language:

english

File:

PDF, 425 KB

english, 1995

8

SPM fabrication of nanometerscale ferromagnetic metal-oxide devices

Jun-ichi Shirakashi, Yasushi Takemura

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2004

Language:

english

File:

PDF, 286 KB

english, 2004

9

AFM lithography for fabrication of magnetic nanostructures and devices

Yasushi Takemura, Jun-ichi Shirakashi

Journal:

Journal of Magnetism and Magnetic Materials

Year:

2006

Language:

english

File:

PDF, 170 KB

english, 2006

10

Nanofabrication of heavily doped p-type GaAs and n-type InGaP by atomic force microscope (AFM)-based surface oxidation process

Yuichi Matsuzaki, Ken-ichiro Yuasa, Jun-ichi Shirakashi, Eduard K Chilla, Akira Yamada, Makoto Konagai

Journal:

Journal of Crystal Growth

Year:

1999

Language:

english

File:

PDF, 192 KB

english, 1999

11

Magnetization Switching of Magnetic Submicron Structure Fabricated by Atomic Force Microscope

Noriyuki Ishii, Tatsuhiko Yokoyama, Hiroki Shibata, Tsutomu Yamada, Jun-ichi Shirakashi, Yasushi Takemura

Journal:

IEEJ Transactions on Electrical and Electronic Engineering

Year:

2008

Language:

english

File:

PDF, 238 KB

english, 2008

12

AFM Nano-oxidation of NiFe Thin Films Capped with Al-Oxide Layers for Planar-type Tunnel Junction

Shunsuke Hasegawa, Shogo Yamada, Tsutomu Yamada, Jun-ichi Shirakashi, Yasushi Takemura

Journal:

IEEJ Transactions on Electrical and Electronic Engineering

Year:

2008

Language:

english

File:

PDF, 238 KB

english, 2008

13

MOMBE growth and characterization of heavily carbon-doped InGaAs

Takumi Yamada, Shinji Nozaki, Ryuji Miyake, Taichi Fukamachi, Jun-ichi Shirakashi, Makoto Konagai, Kiyoshi Takahashi

Journal:

Journal of Crystal Growth

Year:

1991

Language:

english

File:

PDF, 446 KB

english, 1991

14

Electron-beam-induced deposition of carbonaceous microstructures using scanning electron microscopy

Naruhisa Miura, Hideaki Ishii, Jun-ichi Shirakashi, Akira Yamada, Makoto Konagai

Journal:

Applied Surface Science

Year:

1997

Language:

english

File:

PDF, 361 KB

english, 1997

15

Field-emission-induced electromigration method for the integration of single-electron transistors

Shunsuke Ueno, Yusuke Tomoda, Watari Kume, Michinobu Hanada, Kazutoshi Takiya, Jun-ichi Shirakashi

Journal:

Applied Surface Science

Year:

2012

Language:

english

File:

PDF, 686 KB

english, 2012

16

Scratch direction and threshold force in nanoscale scratching using atomic force microscopes

Ampere A. Tseng, Chung-Feng Jeffrey Kuo, Shyankay Jou, Shinya Nishimura, Jun-ichi Shirakashi

Journal:

Applied Surface Science

Year:

2011

Language:

english

File:

PDF, 1.26 MB

english, 2011

17

Fabrication of planar-type Ni/vacuum/Ni tunnel junctions based on ferromagnetic nanogaps using field-emission-induced electromigration

Watanabe, Takato, Takiya, Kazutoshi, Shirakashi, Jun-ichi

Journal:

Journal of Applied Physics

Year:

2011

Language:

english

File:

PDF, 1.27 MB

english, 2011

18

Measurement of faradaic current during AFM local oxidation of magnetic metal thin films

Takemura, Yasushi, Shimada, Yasuyuki, Watanabe, Genta, Yamada, Tsutomu, Shirakashi, Jun-ichi

Journal:

Journal of Physics Conference Series

Year:

2007

Language:

english

File:

PDF, 514 KB

english, 2007

19

[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - In-situ observation of temperature distribution of microheaters using near-infrared CCD imaging system

Saito, Takanari, Lin, Weichih, Atsumo, Ibuki, Shirakashi, Jun-ichi

Year:

2013

Language:

english

File:

PDF, 733 KB

english, 2013

20

Scratch Nanolithography on Si Surface Using Scanning Probe Microscopy: Influence of Scanning Parameters on Groove Size

Ogino, Takumi, Nishimura, Shinya, Shirakashi, Jun-ichi

Journal:

Japanese Journal of Applied Physics

Year:

2008

Language:

english

File:

PDF, 165 KB

english, 2008

21

Scratching properties of nickel-iron thin film and silicon using atomic force microscopy

Tseng, Ampere A., Shirakashi, Jun-ichi, Nishimura, Shinya, Miyashita, Kazuya, Notargiacomo, Andrea

Journal:

Journal of Applied Physics

Year:

2009

Language:

english

File:

PDF, 822 KB

english, 2009

22

[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - Nanoscale mechanical scratching of graphene using scanning probe microscopy

Suda, Ryutaro, Saito, Takanari, Tseng, Ampere A., Shirakashi, Jun-ichi

Year:

2013

Language:

english

File:

PDF, 646 KB

english, 2013

23

[IEEE 2012 IEEE 12th International Conference on Nanotechnology (IEEE-NANO) - Birmingham, United Kingdom (2012.08.20-2012.08.23)] 2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO) - In-situ control of quantum point contacts using scanning probe microscopy scratch lithography

Suda, Ryutaro, Ohyama, Takahiro, Tseng, Ampere A., Shirakashi, Jun-ichi

Year:

2012

Language:

english

File:

PDF, 1.25 MB

english, 2012

24

[IEEE 2013 IEEE International Nanoelectronics Conference (INEC) - Singapore, Singapore (2013.01.2-2013.01.4)] 2013 IEEE 5th International Nanoelectronics Conference (INEC) - Conduction mechanism of single-electron transistors fabricated by field-emission-induced electromigration

Akimoto, Shunsuke, Suda, Ryutaro, Ito, Mitsuki, Ando, Masazumi, Shirakashi, Jun-ichi

Year:

2013

Language:

english

File:

PDF, 424 KB

english, 2013

25

RC-coupled ferromagnetic single-electron transistors

Shirakashi, Jun-ichi, Takemura, Yasushi

Journal:

Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 293 KB

english, 2003

26

Applied voltage dependence of nano-oxidation of ferromagnetic thin films using atomic force microscope

Takemura, Yasushi, Kidaka, Seiichi, Watanabe, Keizo, Nasu, Yasuaki, Yamada, Tsutomu, Shirakashi, Jun-ichi

Journal:

Journal of Applied Physics

Year:

2003

Language:

english

File:

PDF, 378 KB

english, 2003

27

Tunnel magnetoresistance on ferromagnetic single-electron transistors with multiple tunnel junction

Shirakashi, Jun-ichi, Takemura, Yasushi

Journal:

Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 280 KB

english, 2001

28

Resistively coupled ferromagnetic single-electron transistors

Shirakashi, Jun-ichi, Takemura, Yasushi

Journal:

Journal of Applied Physics

Year:

2002

Language:

english

File:

PDF, 300 KB

english, 2002

29

298 K operation of Nb/Nb oxide-based single-electron transistors with reduced size of tunnel junctions by thermal oxidation

Shirakashi, Jun-ichi, Matsumoto, Kazuhiko, Miura, Naruhisa, Konagai, Makoto

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 388 KB

english, 1998

30

Metalorganic molecular beam epitaxy of heavily carbon-doped InP using tertiarybutylphosphine as a carbon auto-doping source

Oh, Je-Hwan, Shirakashi, Jun-ichi, Fukuchi, Fumihiko, Konagai, Makoto

Journal:

Applied Physics Letters

Year:

1995

Language:

english

File:

PDF, 253 KB

english, 1995

31

Single-electron charging effects in Nb/Nb oxide-based single-electron transistors at room temperature

Shirakashi, Jun-ichi, Matsumoto, Kazuhiko, Miura, Naruhisa, Konagai, Makoto

Journal:

Applied Physics Letters

Year:

1998

Language:

english

File:

PDF, 254 KB

english, 1998

32

[IEEE 2013 IEEE 13th International Conference on Nanotechnology (IEEE-NANO) - Beijing, China (2013.08.5-2013.08.8)] 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) - Tuning of resistance of nanogaps using field-emission-induced electromigration with feedback control scheme

Ando, Masazumi, Akimoto, Shunsuke, Suda, Ryutaro, Shirakashi, Jun-ichi

Year:

2013

Language:

english

File:

PDF, 366 KB

english, 2013

33

Ultrafast feedback-controlled electromigration using a field-programmable gate array

Kanamaru, Yuma, Ando, Masazumi, Shirakashi, Jun-ichi

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2015

Language:

english

File:

PDF, 2.35 MB

english, 2015

34

[IEEE 2013 IEEE 13th International Conference on Nanotechnology (IEEE-NANO) - Beijing, China (2013.08.5-2013.08.8)] 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) - Electrical properties of nanogap-based single-electron transistors fabricated by field-emission-induced electromigration

Suda, Ryutaro, Akimoto, Shunsuke, Morihara, Kohei, Shirakashi, Jun-ichi

Year:

2013

Language:

english

File:

PDF, 364 KB

english, 2013

35

Scratch properties of nickel thin films using atomic force microscopy

Tseng, Ampere A., Shirakashi, Jun-ichi, Jou, Shyankay, Huang, Jen-Ching, Chen, T. P.

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2010

Language:

english

File:

PDF, 729 KB

english, 2010

36

[IEEE 2011 IEEE 11th International Conference on Nanotechnology (IEEE-NANO) - Portland, OR, USA (2011.08.15-2011.08.18)] 2011 11th IEEE International Conference on Nanotechnology - Simultaneous tuning of tunnel resistance of integrated nanogaps by field-emission-induced electromigration

Ito, Mitsuki, Ueno, Shunsuke, Watanabe, Takato, Akimoto, Shunsuke, Shirakashi, Jun-ichi

Year:

2011

Language:

english

File:

PDF, 392 KB

english, 2011

37

[IEEE 2013 IEEE 13th International Conference on Nanotechnology (IEEE-NANO) - Beijing, China (2013.08.5-2013.08.8)] 2013 13th IEEE International Conference on Nanotechnology (IEEE-NANO 2013) - In-situ temperature measurements of Joule-heated graphene using near-infrared CCD imaging system

Saito, Takanari, Suda, Ryutaro, Shirakashi, Jun-ichi

Year:

2013

Language:

english

File:

PDF, 797 KB

english, 2013

38

[IEEE 2011 IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS) - Kaohsiung, Taiwan (2011.02.20-2011.02.23)] 2011 6th IEEE International Conference on Nano/Micro Engineered and Molecular Systems - Investigation of electromigration in micrometer-scale metal wires by in-situ optical microscopy

Kuwabara, Yosuke, Nishimura, Shinya, Zaharuddin, Rizal, Shirakashi, Jun-ichi

Year:

2011

Language:

english

File:

PDF, 599 KB

english, 2011

39

P-Type Carbon-Doped InGaAs Grown by Metalorganic Molecular Beam Epitaxy

Shirakashi, Jun-ichi, Yamada, Takumi, Qi, Ming, Nozaki, Shinji, Takahashi, Kiyoshi, Tokumitsu, Eisuke, Konagai, Makoto

Journal:

Japanese Journal of Applied Physics

Year:

1991

File:

PDF, 471 KB

1991

40

Low Temperature Growth of Heavily Carbon-Doped GaAs by Metalorganic Molecular Beam Epitaxy with Elemental Gallium

Nagao, Keisuke, Shirakashi, Jun-ichi, Konagai, Makoto, Takahashi, Kiyoshi

Journal:

Japanese Journal of Applied Physics

Year:

1994

File:

PDF, 684 KB

1994

41

InGaP/GaAs Heterojunction Bipolar Transistors with an Ultra-High Carbon-Doped Base ( p =1.5×10 21c m -3 )

Shirakashi, Jun-ichi, Azuma, Toshiaki, Fukuchi, Fumihiko, Konagai, Makoto, Takahashi, Kiyoshi

Journal:

Japanese Journal of Applied Physics

Year:

1995

File:

PDF, 724 KB

1995

42

Characterization of Polarity of Plasma-Assisted Molecular Beam Epitaxial GaN{0001} Film Using Coaxial Impact Collision Ion Scattering Spectroscopy

Sonoda, Saki, Shimizu, Saburo, Suzuki, Yasumasa, Balakrishnan, Krishnan, Shirakashi, Jun-ichi, Okumura, Hajime

Journal:

Japanese Journal of Applied Physics

Year:

2000

Language:

english

File:

PDF, 99 KB

english, 2000

43

[IEEE 2014 IEEE 14th International Conference on Nanotechnology (IEEE-NANO) - Toronto, ON, Canada (2014.8.18-2014.8.21)] 14th IEEE International Conference on Nanotechnology - A fully customized hardware system for ultra-fast feedback-controlled electromigration using FPGA

Kanamaru, Yuma, Ando, Masazumi, Suda, Ryutaro, Shirakashi, Jun-ichi

Year:

2014

Language:

english

File:

PDF, 539 KB

english, 2014

44

Controlling the tunnel resistance of suspended Ni nanogaps using field-emission-induced electromigration

Toyonaka, Takahiro, Morihara, Kohei, Takikawa, Kazuki, Ito, Mitsuki, Shirakashi, Jun-ichi

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2015

Language:

english

File:

PDF, 1.31 MB

english, 2015

45

Planar-type Ferromagnetic Tunnel Junctions Fabricated by Atomic Force Microscope for Nonvolatile Memory

Takemura, Yasushi, Shirakashi, Jun-ichi

Journal:

Japanese Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 212 KB

english, 2001

46

Direct Modification of Magnetic Domains in Co Nanostructures by Atomic Force Microscope Lithography

Takemura, Yasushi, Hayashi, Satomi, Okazaki, Fuminori, Yamada, Tsutomu, Shirakashi, Jun-ichi

Journal:

Japanese Journal of Applied Physics

Year:

2005

Language:

english

File:

PDF, 201 KB

english, 2005

47

Surface Modification of Niobium (Nb) by Atomic Force Microscope (AFM) Nano-Oxidation Process

Shirakashi, Jun-ichi, Ishii, Masami, Matsumoto, Kazuhiko, Miura, Naruhisa, Konagai, Makoto

Journal:

Japanese Journal of Applied Physics

Year:

1996

File:

PDF, 695 KB

1996

48

Control of Tunnel Resistance of Nanogaps by Field-Emission-Induced Electromigration

Kayashima, Sho, Takahashi, Keisuke, Motoyama, Motoaki, Shirakashi, Jun-ichi

Journal:

Japanese Journal of Applied Physics

Year:

2007

Language:

english

File:

PDF, 746 KB

english, 2007

49

High-throughput nanogap formation by field-emission-induced electromigration

Ito, Mitsuki, Morihara, Kohei, Toyonaka, Takahiro, Takikawa, Kazuki, Shirakashi, Jun-ichi

Journal:

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures

Year:

2015

Language:

english

File:

PDF, 3.07 MB

english, 2015

50

Room Temperature Operation of Amorphous Carbon-Based Single-Electron Transistors Fabricated by Beam-Induced Deposition Techniques

Miura, Naruhisa, Numaguchi, Tetsuyuki, Yamada, Akira, Konagai, Makoto, Shirakashi, Jun-ichi

Journal:

Japanese Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 931 KB

english, 1998